Symposium

Symposium D-7:
Innovative Imaging Technologies and Applications from Nanometrologies to Bioinstrumentations

Organizers:

Representative
  • Kazuhiro HARA
Kyushu University
  • Yoshinori CHIKAURA
Kyushu University
Co-Organizers
  • Masami ANDO
Tokyo University of Science
  • Yuji KAWABATA
Kyoto University
  • Yoshiaki KIYANAGI
Hokkaido University
  • Kenji SAKURAI
National Institute for Materials Science
  • Masaki TAKEGUCHI
National Institute for Materials Science
  • Hirofumi YAMADA
Kyoto University
Correspondence
  • Kazuhiro HARA
Kyushu University hara.kazuhiro.590@m.kyushu-u.ac.jp

Scope:

Imaging technologies provides intuitive inspriration via graphical contents and are utilized in various fields from the detection of molecular-scale configurations to the macroscpic diagnosis. Though, on a superficial level, the various imaging technologies have been developing in independent feilds (and have been acheiving remarkable outcomes), the methodology of constructing 2-dimensional or 3-dimensional images seems to have some common purpose in the course of recognizing or undestanding the essential properties of the target objectives. In this symposium, the interdisciplinary reseaches on the various technologies utilizing the "images" from nanometrologies to bioinstrumentations will be presented for understanding the common features in the imaging technologies and for amplifying the prominent technologies charcteristic to the various areas.

Topics:

  • X-Ray Imaging Technologies
  • Neutron Imaging Technologies
  • Utrasound Imaging Technologies
  • Magnetic Resonance Imaging
  • Electron Microsopy
  • Scanning Probe Microscopy
  • Confocal Laser Scanning Microscopy
  • Computerized Tomography
  • Positron Emission Tomography
  • Diagnostic imaging system
  • Novel Imaging Technologies
  • Image Processing

Keynote Speakers:

  • Nobuo TANAKA
Nagoya University

Lecture title: Study of Nano-materials by Advanced Electron Microscopy and its Future Prospects

  • Seizo MORITA
Osaka University

Lecture title: Frontiers of Atomic Force Microscopy (tentative)

Invited Speakers:

  • Takao ABE
Shin-Etsu Handotai Co., Ltd.

Lecture title: A New Model for Intrinsic Point Defects in Silicon Crystals Grown from the Melt: Proof by X-Ray Diffraction Topography

  • Tetsuya YUASA
Yamagata University

Lecture title: CT imaging based on refraction contrast for biomedical use using DFI method

  • Yoshiaki KIYANAGI
Hokkaido University

Lecture title: Micro-structural physical information imaging in a real space of material by using pulsed neutrons

  • Nobuyuki TAKENAKA
Kobe University

Lecture title: Application of Neutron Radiography to Visualization of Multiphase Flow in Energy Machines

  • Naoya SHIBATA
The University of Tokyo

Lecture title: Novel Atomic-resolution STEM Imaging by Segmented Annular all Field Detector

  • Seiji TAKEDA
Osaka University

Lecture title: Operand Structural Study of Nanoparticle Catalysts by Environmental Transmission Electron Microscopy

  • Koji KIMOTO
National Institute for Materials Science

Lecture title: Atomic-resolution Characterization of Oxides using Electron Microscopy

  • Call for Paper
  • Call for Exhibitions
  • Call for Paper